Publications

Good Practices for XPS (and other Types of) Peak Fitting

Bhupinder Singh, Ronald Hesse, Matthew R. Linford
Vacuum Technology & Coating - Characterization of Thin Films and Materials 2015, 2-7
Improved peak-fit procedure for XPS measurements of inhomogeneous samples - Development of the advanced Tougaard background method

R. Hesse, M. Weiß, R. Szargan, R. Streubel, R. Denecke
J. Electron Spectrosc. Relat. Phenom., 2015, 205, 29-51
Comparative study of the modelling of the spectral background of photoelectron spectra with the Shirley and improved Tougaard methods

R. Hesse, M. Weiß, R. Szargan, R. Streubel, R. Denecke
J. Electron Spectrosc. Relat. Phenom., 2013, 186, 44-53
Improved Tougaard background calculation by introduction of fittable parameters for the inelastic electron scattering cross-section in the peak fit of photoelectron spectra with UNIFIT 2011

R. Hesse, R. Denecke
Surf. Interface Anal., 2011, 43, 1514 – 1526
(0.7 MB PDF)
A Practicable Method for Thickness Estimation of Ultrathin Layers from XPS Data with UNIFIT 2011

P. Streubel, R. Hesse, L. Makhova, J. Schindelka, R. Denecke
Technical Report, 2011
2007 Product or sum: comparative tests of Voigt, and product or sum Gaussian and Lorentzian functions in the fitting of synthetic Voigt-based x-ray photoelectron spectra

R. Hesse, P. Streubel, R. Szargan
Surf. Interface Anal., 2007, 39, 381 – 391
(1.2 MB PDF)
Improved accuracy of quantitative analysis using predetermined
spectrometer transmission functions with UNIFIT 2004


R. Hesse, P. Streubel, R. Szargan
Surf. Interface Anal., 2005, 37, 589 - 607
(0.57 MB PDF)
Error estimation in peak-shape analysis of XPS core-level spectra using UNIFIT 2003: how significant are the results of peak fits?

R. Hesse, T. Chassé , P. Streubel, R. Szargan

Surf. Interface Anal. 2004, 36, 1373-1383

(0.2 MB PDF)
Unifit 2002 - universal analysis software for photoelectron spectra

Hesse, R.; Chassé, T.; Szargan
Anal. Bioanal. Chem. 2003, 375, 856-863
(0.16 MB PDF)
Peak shape analysis of core level photoelectron spectrausing UNIFIT for WINDOWS

Hesse, R.; Chassé, T.; Szargan
R. Fresenius J. Anal. Chem. 1999, 365, 48-54
(0.4 MB PDF)